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We currently operate six laboratories within the MRL: Chemistry, Extensive analytical instrumentation for characterization of inorganic materials. Training is available for all instruments. Equipment includes: a PPMS that measures DC Resistivity, AC Transport (AC Resistivity, Hall Coefficient, I-V Curve, & Critical Current), and Heat Capacity for small samples under controlled magnetic field 0 to 70,000 Oersted and temperature from 1.9 to 400 K; a SQUID Magnetometer is used for measuring the magnetic properties of small samples fro 0 to 50,000 Oe between 1.7 and 400 K, with a sensitivity of 10 -9 emu; a TGA/DTA is used for quantitative thermo analysis of a sample to 1100° C, it requires as little as 5 mg of sample; MS Accessory to the TGA for Evolved Gas Analysis; the ICP is used for elemental analysis and measures down to 100 PPB; the X-Ray Diffractometer can measure powders and thin films in the theta theta configuration up to 1500° C; the UV-Vis-NIR Spectrometer measures the of transmission, absorbance, and diffuse reflectance spectrum of powder, solid, liquid, and thin film samples over a range of 220 to 2600 nm; the Fluorimeter measures fluorescence, phosphorescence, and chemiluminescence of solid, powder, liquid, or thin film samples over a range of 200 to 800 nm; the Cahn TGA can measure thermal decomposition to 1500° C in very aggressive atmospheres; two BET Porosimeters can measure the surface area, pore size, and pore size distribution of powder samples; a Pycnometer is used for very precise density measurements of small solid samples. There are also facilities for the synthesis of inorganic materials Computing, with Linux, Windows NT, and SGI workstations, a dedicated Beowulf computer cluster, and the campus SGI Origin 2000 supercomputer. Microscopy and Microanalysis with (i) three FEI transmission electron microscopes (two Tecnai 200kV microscopes and a Titan 300kV one for high resolution TEM/STEM, and EDS/EELS analysis); (ii) three FEI SEMs (XL30FEG, XL40FEG and Inspect S for high resolution SEM imaging, EDS spectrum imaging and cathodluminescence measurement); (iii) a FEI focus ion beam microscope (Duel-beam, Pt-deposition and EDS); (iv) six AFMs (a Asylum MFP-3D SL, a Asylum MFP-3D Bio system, two Veeco Dimensions, and two Veeco Multimode AFMs); (v) a PHI dynamic SIMS and a Kratos XPS System for surface analysis. Polymer Characterization, with equipment for the synthesis of polymers, and monomers (Schlenk lines) as well as polymer analysis equipment: MALDI-TOF MS, two GPC instruments using THF or chloroform as a solvent, Dynamic Light Scattering (DLS), Modulated DSC (MDSC®), DMA and Circular Dichroism (CD). Spectroscopy, housing three Bruker Avance NMR Spectrometers: a 500MHz SB for both solutions and solids, a 300MHz WB for solids, a 200MHz SB for solutions, a Nicolet-Magna 850 IR Spectrometer with a Raman module, and a Varian Cary Eclipse Fluorimeter. X-ray facility, which houses three Rigaku rotating anode and three sealed tube x-ray sources supporting seven state-of-art x-ray spectrometers for (i) small and wide angle x-ray scattering and diffraction, (ii) thin-film characterization, (iii) in-situ powder diffractometry and (iv) small molecule x-ray crystallography. In addition, the facility has extensive optical imaging capabilities including a state-of-art laser scanning confocal microscope.
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