Central Facilities

Chemistry Computing Microscopy & Microanalysis Polymer Characterization Spectroscopy X-Ray

Note: X'Pert Pro has been relocated to CNSI Room 1409.

This latest XRD instrument from Philips Analytical is used primarily for powder diffraction but is also capable of doing texture (pole figure) measurements on bulk materials and thin films. The built-in structural database (PDF) allows rapid identification of phases from powder diffraction data. A Bueller high temperature (>1500 C^o) oven is available for in-situ studies. The instrument has been upgraded with the Panalytical X'celerator detector for high speed powder XRD measurements.

XPERT Diffractometer

Features

• X-ray source: Philips high intensity ceramic sealed tube (3kW)
• Wavelength: Cu Ka (1.5405 Å)
• Incident beam optics: 2 interchangeable fixed slits and one Soller slit.
• Diffracted beam optics: fixed slit plus programmable receiving slit, graphite analyzer
• Detectors: sealed proportional counter and X'celerator PSD for high speed data collection
• Sample stage: powder stage, texture cradle with sample translation
• Software: Philips X’PERT suite: Data Collector, Graphics & Identify, Texture

With Bueller high temperature oven

Example Data

Powder XRD data collected on XPERT

Help Files

• Data collection
• Data processing - Refer to software manual for HighScore, the data processing and phase identification program from Panalytical
• Slit Settings - Refer to data collection guide

Click here to sign up for time on the XPERT (authorized users only)