Central Facilities

Chemistry Computing Microscopy & Microanalysis Polymer Characterization Spectroscopy X-Ray

Click on the images to learn more about the capabilities of the instruments.

Philips XPERT Powder Diffractometer	Bruker D8 Advance Powder Diffractometer
Panalytical MRD PRO Thin Film Diffractometer (I)	Panalytical MRD PRO Thin Film Diffractometer (II)

Small Angle X-ray Spectrometer (SAXS)		Intermediate SAXS (2-Circle)
Wide Angle X-ray (4-Circle)		Ancillary Equipment
Confocal Microscope

XRD Capabilities

• Powder Diffraction/Texture Analysis (Pole Figures): Philips XPERT MPD, Bruker D8
• High Resolution Thin Film Diffraction: Philips Materials Research Diffractometer (MRD)
• X-ray Reflectivity/Film Thickness Measurement: Philips MRD, Custom 4-circle.
• Residual Stress Measurement: Philips XPERT, Philips MRD
• Small Angle X-ray Scattering: Ultra-SAXS, Intermediate SAXS
• Optical Imaging and Spectroscopy: Nikon microscope, Perkin-Elmer UV/VIS

Help files and FAQ’s

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