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Sara's Project Page |
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Intern: Sara Petrella
Mentor: David Andeen
Faculty Supervisor: Professor Fred Lange
Department: Materials |
X-RAY ANALYSIS ON ZINC OXIDE
X-ray diffraction was performed on hydrothermally deposited
zinc oxide films in order to analyze the quality of the film. Methods
of analysis employed include the Warren-Averbach method and the Integral-Breadth
method. Warren-Averbach analysis requires a Fourier series fit of a diffraction
peak to obtain information on grain size and strain for different length scales.
The Integral-Breadth Method strictly takes into account width of a diffraction
peak. The two methods should agree with each other in order to reinforce
the results. Assuming a gaussian peak, we have fit curves to our data
by means of a Fourier series typical of Warren-Averbach. In addition we
have developed an algorithm for a goodness of fit of our data with the Fourier
series.
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