Equipment:
Click here for current recharge rates.

Development Engineer:
Will be calculated accordingly.

 

Training class or Workshops for FIB and AFM are available upon request.
Contact Dr. Ravit Silverstein

Training class or Workshops for TEM and HRTEM are available upon request.
Contact Dr. Ravit Silverstein

 

 

The MRL strives to maintain the Microscopy and Microanalysis Facility instruments information up to date. However, we recommend accessing their official webpage: www.materials.ucsb.edu

This Facility is managed by the UCSB Materials Department, which is separate from the MRL. External users wishing to access this facility should contact one of the Facility Managers below with inquiries.

Facility Director

Dr. Daniel S. Gianola

Facility Managers

Dr. Tom Mates
  • Secondary Ion Mass Spectrometry (SIMS)
  • X-ray Photoelectron Spectroscopy (XPS)
  • LEAP 3000X HR Atom Probe
Dr. Ravit Silverstein
  • Scanning Electron Microscopes
  • Transmission Electron Microscopes (TEM) Technical Manager
  • Sample preparation
  • Atomic Force Microscopes (AFM), Technical Manager
  • Accounting

Dr. Ravit Silverstein
  • Focus Ion Beam Microscopes (FIB), Technical Manager
  • Transmission Electron Microscopes (TEM), Technical Manager
  • TEM sample preparation
  • TEM sample preparation using FIB
  • High Resolution TEM, Analytical Techniques

Facility Location

1st Floor of CNSI Building