Forward recoil spectrometry1 offers a complementary method for depth profiling polymers labelled with deuterium in the top 500 nm of a polymer film. We can use it to measure the diffusion block copolymers near the polymer surface. A thin film (about 15 nm) thick of a poly(deuterostyrene-b-2-vinylpyridine) is allowed to diffuse into a bottom film of poly(styrene-b-2-vinylpyridine). In the FRES analysis a beam of high energy 4He2+ ions hits the sample at a angle of about 75o to the normal. The energies of recoiling 2H and 1H nuclei are measured with an semiconductor detector. The resulting yield (number of recoiling nuclei per incident ion) versus energy may be analysed to give the concentration versus depth profile of the diffusing deuterium labelled block copolymers in order to determine their self diffusion coefficient. Our high energy ion beam analysis is carried out remotely in the Ion Beam Analysis Facility of the Cornell Center for Materials Research using software that allows us to view and collect the data at UCSB. 1For details see: "Ion Beam Analysis of Polymer Surfaces and Interfaces", E.J. Kramer, MRS Bulletin,21 37 (1996). Link to the Web Page of the CCMR Ion Beam Facility Return to the Kramer Group Home Page