An example of a SIMS analysis of a polymer thin film. The different lines represent the intensities of negative ions with different masses coming from different components of the film. The film consists of a layer of polybutadiene (about 50 nm), on top of a layer of polystyrene about 300 nm thick on top of a layer of a block copolymer of deuterated polystyrene and 2-vinylpyridine (dPS-PVP) on top of a silicon substrate. The block copolymer consists of layers (about 30 nm thick) of spherical domains of PVP surrounded by dPS. The carbon content (green, mass 12 line) of the polymer layers is nearly constant, but the CN- (purple, mass 26) intensity and the hydrogen 1H- (black, mass 1) intensity show strong oscillations over the block copolymer region corresponding to the layers of PVP spheres. The deuterium 2H- (red, mass 2) intensity is low where the CN- intensity is high since it is in the dPS matrix around the PVP. We can use dynamic SIMS to follow diffusion of deuterium labeled copolymer from layer layer in unlabeled copolymer. The block copolymer research is supported by NSF-DMR-Polymers Program under grant DMR-9803738. The dynamic SIMS at UCSB was funded in part by an instrumentation grant from the NSF-DMR-Instrumentation Program, award number 9703930. Link to the Web Page of the UCSB SIMS Facility Return to the Kramer Group Home Page