Current Group Members

Susanne Stemmer (x 6128, stemmer at mrl.ucsb.edu)

Dr. Roman Engel-Herbert (rengelhe at mrl.ucsb.edu): Oxide thin film growth by MBE; gate dielectrics for III-V CMOS

Dr. Nicholas Rudawski (ngr at mrl.ucsb.edu): (Scanning) transmission electron microscopy and atom probe tomography

Mr. James LeBeau (lebeau at mrl.ucsb.edu): Scanning transmission electron microscopy techniques

Mr. Junwoo Son (json at mrl.ucsb.edu): Nanoscale ferroelectrics and transport in ferroelectric films.

Mr. Bharat Jalan (bjalan at mrl.ucsb.edu): Oxide thin film growth by MBE.

Mr. Yoontae Hwang (ythwang at mrl.ucsb.edu): Gate dielectrics for III-V CMOS.

Mr. Nick Wright (njwright at umail.ucsb.edu): Ferroelectric films by MBE.

Mr. Pouya Moetakef (pmoetakef at umail.ucsb.edu): Strongly correlated oxide films by MBE.

Administrative Assistant: Joanne McNie (x5366, jmcnie at engineering.ucsb.edu)

Alumni (current affiliation)

Professor Tae-Yeon Seong (tyseong at korea.ac.kr)

Dr. Joel Cagnon

Dr. Melody Agustin (Applied Materials)

Dr. Jiwei Lu (University of Virginia)

Dr. Steffen Schmidt (Ludwig-Maximilians-Universität, München, Germany)

Ms. Yan Yang (Unity Semiconductor)

Dr. Zhiqiang Chen (Monsanto)

Dr. Young-Woo Ok (Korea University)

Mr. Sean Keane

Dr. Dmitri Klenov (FEI Corp.)

Mr. Nick Finstrom (Hutchinson Technology Inc.)

Mr. Damien Boesch (Vitex Systems)