Scanning transmission electron microscopy (STEM) is an advanced imaging technique in which
a high energy electron beam is scanned across a sample. One of the possible methods to extract
information from the transmitted beam, revealing the projected electromagnetic fields of the
sample, is to use a segmented detector with differential phase contrast (DPC). Since DPC is
reliant on the deflection of electrons through the sample, the electron beam must be centered on
the detector in order to obtain quantifiable data. This can be done by operating the beam
deflecting lenses until the intensities of the detector segments are at similar levels. However, this
manual method has proven to be inconsistent due to susceptibility to human error and possible
gain difference between the intensity channels. In order to eliminate this issue we have created a
user friendly and reproducible automated system which scans the regions of the detector and
moves the beam to the calculated center of mass.